Patent · US Active

Method of manufacturing polishing pad having detection window

US8609001B2 · kind B2 · utility

2Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 8, 2010
Grant dateDec 17, 2013
Priority date
Expiry dateJan 10, 2032

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24D18/00
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A polishing pad having a detection window and a method of manufacturing the polishing pad are provided. A dummy detection window is pre-disposed in a mold. A polishing layer precursor is filled into the mold, and then a solidifying process is performed to form a polishing layer, wherein the polishing layer and the dummy detection window are separable completely. The polishing layer and the dummy detection window are separated from each other so as to form a detection opening in the polishing layer. The detection opening can alternatively be formed in a mold having a protrusion structure to replace the dummy detection window. A detection window precursor is filled into the detection opening, and then a solidifying process is performed to form a detection window.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.