Patent · US Active

Method for producing a substrate including a step of thinning with stop when a porous zone is detected

US8617908B2 · kind B2 · utility

3Cited by
5References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 10, 2011
Grant dateDec 31, 2013
Priority date
Expiry dateMar 10, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/12
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for producing a substrate, the method including: forming a porous zone in an inner layer of the substrate; progressively thinning a thickness of the substrate towards the inner layer including the porous zone; completing the progressively thinning by polishing; and controlled stopping of the polishing by detecting the porous zone during the polishing, the detecting including measuring at least one measurable physical parameter admitting a significant variation during a transition between two layers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.