Patent · US Active

Plasma processing apparatus

US8623171B2 · kind B2 · utility

5Cited by
8References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 3, 2009
Grant dateJan 7, 2014
Priority date
Expiry dateOct 20, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32623
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus includes a process chamber, a platen positioned in the process chamber for supporting a workpiece, a source configured to generate a plasma in the process chamber having a plasma sheath adjacent to the front surface of the workpiece, and an insulating modifier. The insulting modifier is configured to control a shape of a boundary between the plasma and the plasma sheath so a portion of the shape of the boundary is not parallel to a plane defined by a front surface of the workpiece facing the plasma. Controlling the shape of the boundary between the plasma and the plasma sheath enables a large range of incident angles of particles striking the workpiece to be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.