Dynamic trim method for non-volatile memory products
US8630137B1 · kind B1 · utility
1Cited by
5References
11Claims
0Family size
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Key dates
| Filing date | Feb 15, 2011 |
| Grant date | Jan 14, 2014 |
| Priority date | — |
| Expiry date | Apr 22, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A dynamic trim method includes testing a selected number of cells on a die with predetermined testing margins. Data from this testing is used to determine dynamic reference margins for improving yield. Advantageously, yield is improved by allowing functioning fast or slow units to pass wafer sort by applying the dynamic reference margins for varying processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.