Asymmetric hetero-structure FET and method of manufacture
US8637871B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 4, 2010 |
| Grant date | Jan 28, 2014 |
| Priority date | — |
| Expiry date | Mar 4, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/693
Abstract
An asymmetric hetero-structure FET and method of manufacture is provided. The structure includes a semiconductor substrate and an epitaxially grown semiconductor layer on the semiconductor substrate. The epitaxially grown semiconductor layer includes an alloy having a band structure and thickness that confines inversion carriers in a channel region, and a thicker portion extending deeper into the semiconductor structure at a doped edge to avoid confinement of the inversion carriers at the doped edge.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.