Method to transfer failure analysis-specific data between design houses and fab's/FA labs
US8645896B1 · kind B1 · utility
9Cited by
2References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2011 |
| Grant date | Feb 4, 2014 |
| Priority date | — |
| Expiry date | Oct 1, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for an IC design house to transfer design and layout information to a fabrication or failure analysis facility on a need-to-know basis to enable effective failure analysis while not providing unnecessary or extraneous information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.