Dynamic power control for nanoscale spectroscopy
US8646319B2 · kind B2 · utility
15Cited by
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24Claims
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Key dates
| Filing date | Feb 23, 2010 |
| Grant date | Feb 11, 2014 |
| Priority date | — |
| Expiry date | Jan 14, 2032 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y35/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.