Patent · US Active

Method and arrangement for outputting residual errors for a function customized to a set of points

US8654128B2 · kind B2 · utility

0Cited by

2References

18Claims

0Family size

Assignee

Carl Zeiss Microscopy GmbH · DE

Inventors

Marcus Heidkamp · Jena, DE
Stephan Wagner-Conrad · Jena, DE
Klaus Weisshart · Jena, DE

Key dates

Filing date	Sep 16, 2008
Grant date	Feb 18, 2014
Priority date	—
Expiry date	Oct 20, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG06T11/206
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

The invention is directed to a method and an arrangement for displaying residual errors of a function which is fitted to a set of points. In the prior art, the residual errors are displayed in a separate graph apart from the function graph so that it is difficult for an observer to discern the quality of the fit of the function to the data points. An improved method and an improved arrangement make it possible to visually assess the quality of the fit in a simple, accurate manner. According to the invention, visual codes are assigned to the fitted function or to the data points of the point set piecewise or pointwise depending on the residual errors, and the fitted function is displayed graphically at an interface, wherein the fitted function is displayed piecewise or pointwise in the form of the assigned visual codes. The invention is preferably used for raster image spectroscopy with laser scanning microscopes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.