Method of estimating curie temperature distribution in a magnetic recording layer
US8666692B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 10, 2011 |
| Grant date | Mar 4, 2014 |
| Priority date | — |
| Expiry date | Feb 6, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2005/0021
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In exemplary embodiments, first and second parameters are obtained for each of different temperatures of the magnetic recording layer. The absolute value of the first parameter for each magnetic grain has a minimum value when the temperature of each magnetic grain reaches a predetermined temperature that increases as the Curie temperature increases, and decreases as the Curie temperature decreases. The second parameter is related to the standard deviation of the coercivity distribution of the magnetic grains divided by the coercivity of the magnetic recording layer. The method calculates a value where the absolute measurement value of the first parameter has a minimum value and the temperature of the magnetic recording layer at which the standard deviation of the coercivity distribution of the magnetic grains divided by the coercivity of the magnetic recording layer has a maximum value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.