Patent · US Active

High voltage bipolar transistor with pseudo buried layers

US8674480B2 · kind B2 · utility

2Cited by
6References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 2010
Grant dateMar 18, 2014
Priority date
Expiry dateDec 13, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/401
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A high voltage bipolar transistor with shallow trench isolation (STI) comprises the areas of a collector formed by implanting first electric type impurities into active area and connected with pseudo buried layers at two sides; Pseudo buried layers which are formed by implanting high dose first type impurity through the bottoms of STI at two sides if active area, and do not touch directly; deep contact through field oxide to contact pseudo buried layers and pick up the collectors; a base deposited on the collector by epitaxial growth and in-situ doped by second electric type impurity, in which the intrinsic base touches local collector and extrinsic base is used for base pick-up; a emitter which is a polysilicon layer deposited on the intrinsic base and doped with first electric type impurities. This invention makes the depletion region of collector/base junction from 1D (vertical) distribution to 2D (vertical and lateral) distribution. The bipolar transistor's breakdown voltages are increased by only enlarge active critical dimension (CD). This is low-cost process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.