Patent · US Active

Developing method for immersion lithography, solvent used for the developing method and electronic device using the developing method

US8679727B2 · kind B2 · utility

1Cited by
4References
8Claims
0Family size

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Key dates

Filing dateJun 24, 2009
Grant dateMar 25, 2014
Priority date
Expiry dateDec 26, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/24802
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A developing method for immersion lithography is provided, realizing a process that is simple and low-cost and enables high repellency sufficient to allow high-speed scanning. The developing method for immersion lithography improved by inexpensive material without introducing any new facility, a solution to be used in the developing method, and an electronic device formed by using the developing method are provided. The developing method for immersion lithography is a method of developing for immersion lithography of an electronic device with a resist containing a surface segregation agent and chemically-amplified resist, including the step of development with alkali immersion, characterized by the dissolving and removing step, conducted using a dissolving and removing solution that selectively dissolves and removes the surface segregation agent of the resist.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.