Performing statistical timing analysis with non-separable statistical and deterministic variations
US8683409B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 15, 2013 |
| Grant date | Mar 25, 2014 |
| Priority date | — |
| Expiry date | Feb 15, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, the invention is a method and apparatus for performing statistical timing analysis with non-separable statistical and deterministic variations. One embodiment of a method for performing timing analysis of an integrated circuit chip includes computing delays and slews of chip gates and wires, wherein the delays and slews depend on at least a first process parameter that is deterministic and corner-based and a second process parameter that is statistical and non-separable with the first process parameter, and performing a single timing run using the timing quantity, wherein the single timing run produces arrival times, required arrival times, and timing slacks at outputs, latches, and circuit nodes of the integrated circuit chip. The computed arrival times, required arrival times, and timing slacks can be projected to a corner value of deterministic variations in order to obtain a statistical model of the delays and slews at the corresponding corner.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.