Patent · US Active

System and method for testing a radio frequency integrated circuit

US8686736B2 · kind B2 · utility

8Cited by

3References

14Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventor

Hans Peter Forstner · Ebersberg, DE

Key dates

Filing date	Nov 23, 2010
Grant date	Apr 1, 2014
Priority date	—
Expiry date	Nov 20, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/3187
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an embodiment, a method of testing a radio frequency integrated circuit (RFIC) includes generating high frequency test signals using the on-chip test circuit, measuring signal levels using on-chip power detectors, and controlling and monitoring the on-chip test circuit using low frequency signals. The RFIC circuit is configured to operate at high frequencies, and an on-chip test circuit that includes frequency generation circuitry configured to operate during test modes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.