Patent · US Active

Method and apparatus for robot calibrations with a calibrating device

US8688398B2 · kind B2 · utility

6Cited by
18References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 14, 2012
Grant dateApr 1, 2014
Priority date
Expiry dateJun 14, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/39056
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Described herein is a method and apparatus for performing calibrations on robotic components. In one embodiment, a method for performing robotic calibrations includes moving the calibrating device across a target (e.g., a wafer chuck). Next, the method includes measuring distances between light spots from the sensors and a perimeter of the target using the sensors located on the calibrating device. Next, the method includes determining a displacement of the calibrating device relative to a center of the target. Then, the method includes determining a rotation angle of the calibrating device relative to a system of coordinates of the target. Next, the method includes calibrating a robot position of the robot based on the displacement and rotation angle of the calibrating device with respect to the target.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.