Patent · US Active

Automated repair method and system for double patterning conflicts

US8701056B1 · kind B1 · utility

6Cited by
5References
37Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 26, 2012
Grant dateApr 15, 2014
Priority date
Expiry dateSep 26, 2032

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02P90/02
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of performing double patterning (DPT) conflict repairs is described. In this method, even cycles adjacent to odd cycles in a layout can be identified (also called adjacent even/odd cycles herein). The identifying can include forming graph constructs of the layout. Route guidances for break-link operations and split-node operations can be prioritized for the adjacent even/odd cycles. A list including the route guidances for the break-link operations and the split-node operations can be generated. The list can be ordered based on the prioritizing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.