Shielded eddy current coils and methods for forming same on printed circuit boards
US8704513B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 16, 2011 |
| Grant date | Apr 22, 2014 |
| Priority date | — |
| Expiry date | Feb 10, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.