Bad column management with bit information in non-volatile memory systems
US8711625B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2011 |
| Grant date | Apr 29, 2014 |
| Priority date | — |
| Expiry date | Nov 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/808
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Column based defect management techniques are presented. Each column of the memory has an associated isolation latch or register whose value indicates whether the column is defective, but in addition to this information, for columns marked as defective, additional information is used to indicate whether the column as a whole is to be treated as defective, or whether just individual bits of the column are defective. The defective elements can then be re-mapped to a redundant element at either the appropriate bit or column level based on the data. When a column is bad, but only on the bit level, the good bits can still be used for data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.