Integrated testing circuitry for high-frequency receiver integrated circuits

US8711981B2 · kind B2 · utility

Assignee

• Freeescale Semiconductor, Inc. · US

Inventors

• Bernhard Dehlink · Unterhaching, DE
• Ralf Reuter · Landshut, DE

Key dates

• Filing date: Jul 17, 2008
• Grant date: Apr 29, 2014
• Expiry date: May 14, 2029

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2851
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

An integrated circuit comprises a receiver and an oscillator circuit. The receiver has a first input port for receiving a first oscillatory input signal, a second input port for receiving a second oscillatory input signal, and an output port for delivering an oscillatory output signal which is a function of both the first input signal and the second input signal. The oscillator circuit has a first output port for delivering a first oscillatory signal, and a second output port for delivering a second oscillatory signal. The first output port of the oscillator circuit is coupled to the HF port, and the second output port of the oscillator circuit is coupled to the LO port. The integrated circuit may be designed such that the HF port may be disconnected from the first output port of the oscillator circuit without affecting the operability of the receiver. An apparatus for testing the proper functioning of an integrated circuit as described above and a method of producing a receiver are also disclosed. The method may facilitate testing a receiver die during production. In particular it may avoid the need for feeding high-frequency signals from an external apparatus to the die.