Patent · US Active

Memory device with error detection

US8719662B2 · kind B2 · utility

5Cited by

28References

33Claims

0Family size

Assignee

Micron Technology, Inc. · US

Inventors

David Eggleston · San Jose, US
Bill Radke · San Francisco, US

Key dates

Filing date	Jan 17, 2011
Grant date	May 6, 2014
Priority date	—
Expiry date	Oct 3, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/1008
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Data move operations in a memory device are described that enable identification of data errors. Error detection circuitry in the memory device can be operated using parity data or ECC data stored in the memory. Results of the error detection can be accessed by a memory controller for data repair operations by the controller.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.