Scan test application through high-speed serial input/outputs
US8726112B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2009 |
| Grant date | May 13, 2014 |
| Priority date | — |
| Expiry date | Jul 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318547
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and devices for using high-speed serial links for scan testing are disclosed. The methods can work with any scheme of scan data compression or with uncompressed scan testing. The protocol and hardware to support high speed data transfer reside on both the tester and the device under test. Control data may be transferred along with scan data or be partially generated on chip. Clock signals for testing may be generated on chip as well. In various implementations, the SerDes (Serializer/Deserializer) may be shared with other applications. The Aurora Protocol may be used to transport industry standard protocols. To compensate for effects of asynchronous operation of a conventional high-speed serial link, buffers may be used. The high-speed serial interface may use a data conversion block to drive test cores.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.