Multiple sample attachment to nano manipulator for high throughput sample preparation
US8729469B1 · kind B1 · utility
9Cited by
5References
17Claims
0Family size
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Key dates
| Filing date | Jul 5, 2013 |
| Grant date | May 20, 2014 |
| Priority date | — |
| Expiry date | Jul 5, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/31745
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved method for extracting and handling multiple samples for S/TEM analysis is disclosed. Preferred embodiments of the present invention make use of a micromanipulator that attaches multiple samples at one time in a stacked formation and a method of placing each of the samples onto a TEM grid. By using a method that allows for the processing of multiple samples, the throughput of sample prep in increased significantly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.