Patent · US Active

Semiconductor device for accelerating erase verification process and method therefor

US8730739B2 · kind B2 · utility

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1References
4Claims
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Key dates

Filing dateJan 17, 2012
Grant dateMay 20, 2014
Priority date
Expiry dateJan 19, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3445
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A semiconductor device and a method for accelerating erase verification process thereof are introduced, in which a correction unit of erase verification is connected between broken bit lines of the semiconductor device and a page buffer. Grounding switches in the correction unit of erase verification are allowed to connect the broken bit lines to ground during an erase verification process by means of a specific circuit arrangement with respect to the broken lines. Thereby, the earth voltage is received, and further, that the broken bit lines pass the erase verification is identified by the page buffer, further saving time consumed in repeated verifications in the conventional technology significantly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.