Method for examining an object using a microscope with delayed control signals and a microscope for examining an object

US8735790B2 · kind B2 · utility

Assignee

• LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

• Ludger Schulte · Ahlen, DE
• Bernd Widzgowski · Dossenheim, DE

Key dates

• Filing date: Nov 25, 2010
• Grant date: May 27, 2014
• Expiry date: May 15, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/0032
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively.