Semiconductor devices including design for test capabilities and semiconductor modules and test systems including such devices
US8742780B2 · kind B2 · utility
3Cited by
1References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2010 |
| Grant date | Jun 3, 2014 |
| Priority date | — |
| Expiry date | Jan 16, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor device includes a resistor terminal, a reference voltage generator and a detector. The resistor terminal is connected to an external resistor. The reference voltage generator generates at least one reference voltage. The detector generates a detection signal based at least in part on a resistor terminal voltage and the at least one reference voltage. The detection signal indicates a state of an electrical connection to the resistor terminal. The resistor terminal voltage is a voltage at the resistor terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.