Patent · US Active

Integrated X-ray source having a multilayer total internal reflection optic device

US8744048B2 · kind B2 · utility

29Cited by

11References

22Claims

0Family size

Assignee

General Electric Company · US

Inventors

Susanne Madeline Lee · Cocoa, US
Peter Michael Edic · Albany, US
Forrest Frank Hopkins · Cohoes, US
Alfried Haase · Ahrensburg, DE
Eberhard Neuser · Wunstorf, DE

Key dates

Filing date	Dec 28, 2010
Grant date	Jun 3, 2014
Priority date	—
Expiry date	Nov 24, 2032

Classification

Technology area (CPC H)Electricity
CPC primaryH01J35/08
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

An integrated X-ray source is provided. The integrated X-ray source includes a target for emitting X-rays upon being struck by one or more excitation beams, and one or more total internal reflection multilayer optic devices in physical contact with the target to transmit at least a portion of the X rays through total internal reflection to produce X-ray beams, wherein the optic device comprises an input face for receiving the X rays and an output face through which the X-ray beams exit the integrated X-ray source.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.