Integrated circuit with an adaptable contact pad reconfiguring architecture
US8744368B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2011 |
| Grant date | Jun 3, 2014 |
| Priority date | — |
| Expiry date | Aug 4, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2005/00058
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An apparatus and method are disclosed for providing test mode contact pad reconfigurations that expose individual internal functional modules or block groups in an integrated circuit for testing and for monitoring. A plurality of switches between each functional module switches between passing internal signals among the blocks and passing in/out signals external to the block when one or more contact pads are strapped to input a pre-determined value. Another set of switches between the functional modules and input/output contact pads switch between functional inputs to and from the functional modules and monitored signals or input/output test signals according to the selected mode of operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.