Method for inspecting a photovoltaic substrate
US8766192B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 2010 |
| Grant date | Jul 1, 2014 |
| Priority date | — |
| Expiry date | May 1, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/359
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting a substrate having intrinsic heterogeneous patterns for the presence of cracks comprises the steps of providing an optical device and front-side lighting on a first side of the substrate and providing near-infrared lighting on a second side of the substrate opposite to the first side. The near-infrared lighting is operable to penetrate the substrate so as to be detectable by the optical device through the substrate. One or more images are obtained by illuminating the substrate with the front-side lighting and/or the near-infrared lighting from the second side. The one or more images are thereafter processed to distinguish between the heterogeneous patterns on the substrate and any cracks present on the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.