System and method for inspection of electrical circuits
US8773140B2 · kind B2 · utility
0Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2011 |
| Grant date | Jul 8, 2014 |
| Priority date | — |
| Expiry date | Mar 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/309
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for inspection of electrical circuits including a calibration subsystem operative to apply a time varying voltage to an electrical circuit being inspected during calibration and to sense differences in an electrical state at various different locations in the electrical circuit being inspected, thereby providing an indication of location of defects therein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.