Inspection method
US8773158B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 23, 2011 |
| Grant date | Jul 8, 2014 |
| Priority date | — |
| Expiry date | May 26, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2642
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.