Chien-Ping Wang
8Patents
1h-index
22Co-inventors
47Inventor score
Filing activity: May 23, 2011 → Feb 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9726713B2 | Testing method and testing system for semiconductor element | Physics | 1 | Active |
| US9523572B2 | Thin-film curvature measurement apparatus and method thereof | Physics | 1 | Active |
| US12009177B2 | Detection using semiconductor detector | Electricity | 0 | Active |
| US9341669B2 | Testing apparatus | Physics | 0 | Active |
| US8773158B2 | Inspection method | Physics | 0 | Active |
| US9110125B2 | Method and apparatus for detecting relationship between thermal and electrical properties of semiconductor device | Physics | 0 | Active |
| US9557368B2 | Method of measuring thermal electric characteristics of semiconductor device | Physics | 0 | Active |
| US11306711B2 | Miniature cooling system | Mechanical Engineering; Lighting; Heating | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.