Physical properties measuring method and apparatus
US8780193B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Mar 25, 2011 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Nov 13, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2805
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A physical properties measuring method includes: acquiring an experimental convergent beam electron diffraction image of a sample by using a transmission electron microscope; calculating Zernike moment intensities of the experimental convergent beam electron diffraction image; and comparing the Zernike moment intensities of the experimental convergent beam electron diffraction image with Zernike moment intensities of calculated convergent beam electron diffraction images calculated on changed physical properties of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.