Takeshi Soeda
9Patents
2h-index
3Co-inventors
40Inventor score
Filing activity: Aug 8, 2003 → Mar 5, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7084400B2 | Lattice strain measuring system and method | Electricity | 4 | Expired |
| US6822234B2 | Method for measuring localized region lattice strain by means of convergent beam electron diffraction, and measurement device thereof | Physics | 2 | Expired |
| US7342226B2 | Stress measuring method and system | Physics | 2 | Expired |
| US11650579B2 | Information processing device, production facility monitoring method, and computer-readable recording medium recording production facility monitoring program | Emerging Cross-Sectional Technologies | 2 | Active |
| US8780193B2 | Physical properties measuring method and apparatus | Electricity | 0 | Active |
| US7571653B2 | Stress measuring method and system | Physics | 0 | Active |
| US8299430B2 | Electron microscope and observation method | Electricity | 0 | Active |
| US11199833B2 | Quality determination method, quality determination device, quality determination system and computer-readable non-transitory medium | Emerging Cross-Sectional Technologies | 0 | Active |
| US11054460B2 | Soft error inspection method, soft error inspection apparatus, and soft error inspection system | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.