Patent · US Active

Silicon wafer polishing composition and related methods

US8795548B1 · kind B1 · utility

1Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 11, 2013
Grant dateAug 5, 2014
Priority date
Expiry dateApr 11, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

A chemical mechanical polishing composition for polishing silicon wafers is provided, containing: water; a cation according to formula (I); piperazine or a piperazine derivative according to formula (II); and, optionally, a pH adjusting agent; wherein the polishing composition exhibits a silicon removal rate of at least 300 nm/min. Also provided are methods of making and using the chemical mechanical polishing composition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.