Patent · US Active

Method for manufacturing semiconductor devices having a glass substrate

US8803312B2 · kind B2 · utility

2Cited by
21References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 14, 2013
Grant dateAug 12, 2014
Priority date
Expiry dateAug 14, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/66
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing semiconductor devices is disclosed. A semiconductor wafer is provided having a first surface and a second surface opposite to the first surface. A first glass substrate is provided which has at least one of cavities and openings at the bonding surface. The first glass substrate is bonded to the first surface of the semiconductor wafer such that the metal pads are arranged within respective cavities or openings of the first glass substrate. The second surface of the semiconductor wafer is machined. At least one metallization region is formed on the machined second surface of the semiconductor wafer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.