Automatic generation of valid at-speed structural test (ASST) test groups

US8825433B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Konda R. Baalaji · Savanuru, IN
• Malede W. Berhanu · Colchester, US
• Vikram Iyengar · South Burlington, US
• Douglas C. Pricer · Somerville, US

Key dates

• Filing date: Sep 23, 2011
• Grant date: Sep 2, 2014
• Expiry date: Oct 29, 2032

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31726
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and system is provided for automatically generating valid at speed structural test (ASST) test groups. The method includes loading a netlist for an integrated circuit into a processor. The method further includes determining a plurality of clock domain crossings between a plurality of clock domains within the integrated circuit. The method further includes generating a first test group. The method further includes adding a first clock domain of the plurality of clock domains to the first test group. The method further includes adding a second clock domain of the plurality of clock domains to the first test group when the second clock domain does not have a clock domain crossing into the first clock domain.