Patent · US Active

Method for etching a material in the presence of solid particles

US8828872B2 · kind B2 · utility

0Cited by
4References
14Claims
0Family size

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Key dates

Filing dateMay 12, 2010
Grant dateSep 9, 2014
Priority date
Expiry dateJul 29, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32134
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a method for etching a structure (1) including at least one material (4) to be etched, said method consisting in: selecting at least one chemical species that can react with the material (4) to be etched; selecting at least one soluble compound that can release this chemical species; producing a solution (11) containing the compound and a powder of particles or solid grains (13) in suspension; placing the material to be etched in the presence of the solution; and producing high-frequency ultrasounds in the solution, at at least one frequency, capable of generating active cavitation bubbles such that the chemical species is generated and reacts with the material to be etched, thereby producing a soluble compound or a precipitate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.