Automated multi-point probe manipulation
US8836358B2 · kind B2 · utility
2Cited by
7References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 30, 2010 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | Jul 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-point probe particularly suitable for automated handling is disclosed. An automated multi-point measuring system including the multi-point probe and a probe manipulator head is also disclosed In addition, an automated multi-point probe gripping system including a probe holder and the probe manipulator head is revealed. Further, a loaded probe loader comprising a probe loader and a probe cassette for handling the multi-point probe is also revealed, where the probe cassette is provided with the probe holder for securing the multi-point probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.