Patent · US Active

Probe card partition scheme

US8836363B2 · kind B2 · utility

4Cited by

7References

20Claims

0Family size

Assignee

TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. · TW

Inventors

Sandeep Kumar Goel · Dublin, US
Mill-Jer Wang · Hsinchu, TW

Key dates

Filing date	Oct 14, 2011
Grant date	Sep 16, 2014
Priority date	—
Expiry date	May 10, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31908
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of probe card partitioning for testing an integrated circuit die includes providing a first probe card partition layout having a first number of distinct sections. Each distinct section uses a distinct probe card for testing. The first probe card partition layout is repartitioned into a second probe card partition layout having a second number of distinct sections. The second number is less than the first number.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.