Patent · US Active

Semiconductor device with a test circuit and a reference circuit

US8847604B2 · kind B2 · utility

6Cited by

2References

25Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Thomas Baumann · Wettingen, CH
Georg Georgakos · Fraunberg, DE
Christian Pacha · Birkenfeld, DE
Anselme Urlick Tchegho Kamgaing · Aachen, DE

Key dates

Filing date	Nov 17, 2011
Grant date	Sep 30, 2014
Priority date	—
Expiry date	Feb 7, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31703
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Implementations are presented herein that include a test circuit and a reference circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.