Patent · US Active

Semiconductor device with appraisal circuitry

US8853795B2 · kind B2 · utility

0Cited by

7References

20Claims

0Family size

Assignee

Freeescale Semiconductor, Inc. · US

Inventors

Hubert M. Bode · Haar, DE
Andreas Laudenbach · Alzenau, DE
Andreas Roth · Gunzenhausen, DE

Key dates

Filing date	Feb 23, 2009
Grant date	Oct 7, 2014
Priority date	—
Expiry date	Jul 23, 2030

Classification

Technology area (CPC H)Electricity
CPC primaryH01L2924/0002
WIPO fieldSemiconductors
WIPO sectorElectrical engineering

Abstract

A semiconductor device comprises a substrate provided with a doping of a first type, on which an electronic circuit is provided surrounded by a circuit portion of the substrate provided with a doping of a second type; at least one pad for connecting the electronic circuit to an external device outside the substrate, surrounded by a pad portion provided with a doping of the second type; a sensing device comprising a sensor portion of the substrate provided with a doping of the first type, for sensing a parameter forming a measure for a local electrical potential of the substrate; and an evaluation unit connected to the sensing device, for providing an evaluation signal based on a difference between the parameter and a reference value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.