Patent · US Active

Device and method for testing a circuit to be tested

US8856629B2 · kind B2 · utility

1Cited by

5References

22Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Thomas Kern · Munich, DE
Ulrich Backhausen · Taufkirchen, DE
Michael Goessel · Roter Dudel, DE
Thomas Rabenalt · Unterhaching, DE

Key dates

Filing date	Sep 7, 2012
Grant date	Oct 7, 2014
Priority date	—
Expiry date	Oct 13, 2032

Classification

Technology area (CPC H)Electricity
CPC primaryH03M13/09
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A device for testing a circuit includes a syndrome determiner, a test sequence provider and an evaluation circuit. The syndrome determiner determines an error syndrome bit sequence (s(v′)) based on a coded binary word (v′). The error syndrome bit sequence (s(v′)) indicates whether the coded binary word (v′) is a code word of an error correction code (C) used for coding the coded binary word (v′). The test sequence provider provides a test bit sequence (Ti) of the circuit that is different than the error syndrome bit sequence (s(v′)), if the error syndrome bit sequence (s(v′)) indicates that the coded binary word (v′) is a code word of the error correction code (C). The evaluation circuit detects an erroneous processing of the test bit sequence (Ti) by the circuit based on a test output signal (R(Ti)′)—caused by the test bit sequence (Ti)—of the circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.