Patent · US Active

Systems and methods for correlated parameters in statistical static timing analysis

US8856709B2 · kind B2 · utility

12Cited by

8References

16Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Eric A. Foreman · Saint Albans, US
Peter A. Habitz · South Burlington, US
David J. Hathaway · Underhill Center, US
Jeffrey G. Hemmett · South Burlington, US
Natesan Venkateswaran · Hopewell Junction, US
Chandramouli Visweswariah · Croton-on-Hudson, US
Vladimir Zolotov · Putnam Valley, US

Key dates

Filing date	Dec 23, 2013
Grant date	Oct 7, 2014
Priority date	—
Expiry date	Dec 23, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06F30/398
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Systems and methods for accommodating correlated parameters in SSTA are provided. The method includes determining a correlation between at least two parameters. The method further includes calculating a new parameter or a new parameter set based on the correlation between the at least two parameters. The method further includes performing the SSTA such that the new parameter or the new parameter set is propagated into the SSTA. The method further includes projecting slack using the correlation between the at least two parameters and using a processor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.