Method and apparatus for testing integrated circuits
US8866501B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 23, 2011 |
| Grant date | Oct 21, 2014 |
| Priority date | — |
| Expiry date | Aug 27, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing an electronic device includes supplying a first voltage output from a voltage regulator to a first power connection terminal of the electronic device to provide power to the electronic device, providing to the voltage regulator a second voltage on a second power connection terminal of the electronic device that is in connection with the first power connection terminal by a first circuit of the electronic device, regulating, using the voltage regulator, the first voltage based on a comparison of the second voltage and a target voltage, and determining whether the electronic device meets a performance requirement while the first voltage is regulated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.