Patent · US Active

Substrates for mirrors for EUV lithography and their production

US8870396B2 · kind B2 · utility

3Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 2, 2012
Grant dateOct 28, 2014
Priority date
Expiry dateNov 2, 2032

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC03C2201/42
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

For the production of mirrors for EUV lithography, substrates are suggested having a mean relative thermal longitudinal expansion of no more than 10 ppb across a temperature difference ΔT of 15° C. and a zero-crossing temperature in the range between 20° C. and 40° C. For this purpose, at least one first and one second material having low thermal expansion coefficients and opposite gradients of the relative thermal expansion as a function of temperature are selected and a substrate is produced by mixing and bonding these materials.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.