Patent · US Active

Chemical mechanical polishing system

US8882563B2 · kind B2 · utility

2Cited by
18References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateApr 27, 2011
Grant dateNov 11, 2014
Priority date
Expiry dateAug 16, 2033

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/30
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

The invention relates to a chemical mechanical polishing system, comprising: at least one polishing platens rotatably installed with a platen pad mounted on its upper surface; a guide rail disposed along a predetermined path; a substrate carrier unit including a rotary union to downwardly press a substrate during a polishing process, the substrate carrier unit moving along the guide rail with loading the substrate; and a docking unit installed to be docked to the substrate carrier unit so as to supply air pressure to the rotary union which downwardly presses the substrate held by the substrate carrier unit, when the substrate carrier unit is positioned over the polishing platen, whereby even though the substrate carrier unit is moved to consecutively polish the substrate on the plural polishing platens, it substantially removes a phenomenon of the twisting of air pressure supply tubes due to the movement of the substrate carrier unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.