Dynamic built-in self-test system
US8898530B1 · kind B1 · utility
3Cited by
13References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2013 |
| Grant date | Nov 25, 2014 |
| Priority date | — |
| Expiry date | Oct 23, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50012
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of performing a dynamic built-in self-test (BIST). The method includes performing a first test of a circuit on a semiconductor chip. The first test includes a first switch factor. The circuit during the first test is monitored with one or more sensors. A first sensor value of one or more sensors monitoring the circuit is determined. It is also determined whether the first sensor value is within a range of a programmable constant. A second switch factor is determined in response to determining that the first sensor value outside the range of the programmable constant.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.