Patent · US Active

Plasma processing apparatus and plasma processing method

US8906249B2 · kind B2 · utility

5Cited by
6References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 2008
Grant dateDec 9, 2014
Priority date
Expiry dateAug 23, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3244
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A plasma processing apparatus includes a beam-shaped spacer 7 which is placed at an upper opening of a chamber 3 opposed to a substrate 2 to support a dielectric plate 8. The dielectric plate 8 is supported by the beam-shaped spacer 7. In the beam-shaped spacer 7 are provided a plurality of process gas introducing ports 31, 36 which have a depression angle θd and which are provided downward and directed toward the substrate 2, as well as a plurality of rare gas introducing ports 41 having a elevation angle θe directed toward the dielectric plate 8. Improvement of processing rates such as etching rate as well as effective suppression of wear of the dielectric plate 8 can be achieved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.