Functional testing of a processor design
US8918678B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2013 |
| Grant date | Dec 23, 2014 |
| Priority date | — |
| Expiry date | Dec 12, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2236
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to exemplary embodiments, a computer implemented method for functional testing of a processor design includes accessing a test template from a library of test templates, wherein the test template is configured to test a first selected function of the processor and inputting the test template to an automated test generation tool executed by a computer. The method further includes generating an instruction sequence based on the test template by the automated test generation tool and injecting an event instruction to the instruction sequence during the generating of the instruction sequence by the automated test generation tool, the injecting of the event instruction preserving testing of the first selected function of the processor and the event instruction being configured to test a second selected function of the processor. The method includes verifying a function of the processor by analyzing responses of the processor to the instruction sequence.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.