Patent · US Active

MEMS sensor with stress isolation and method of fabrication

US8925384B2 · kind B2 · utility

5Cited by
10References
20Claims
0Family size

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Key dates

Filing dateMay 29, 2012
Grant dateJan 6, 2015
Priority date
Expiry dateOct 26, 2032

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49117
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A MEMS sensor (20, 86) includes a support structure (26) suspended above a surface (28) of a substrate (24) and connected to the substrate (24) via spring elements (30, 32, 34). A proof mass (36) is suspended above the substrate (24) and is connected to the support structure (26) via torsional elements (38). Electrodes (42, 44), spaced apart from the proof mass (36), are connected to the support structure (26) and are suspended above the substrate (24). Suspension of the electrodes (42, 44) and proof mass (36) above the surface (28) of the substrate (24) via the support structure (26) substantially physically isolates the elements from deformation of the underlying substrate (24). Additionally, connection via the spring elements (30, 32, 34) result in the MEMS sensor (22, 86) being less susceptible to movement of the support structure (26) due to this deformation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.