Patent · US Active

Method for manufacturing nitride based single crystal substrate and method for manufacturing nitride based semiconductor device

US8932891B2 · kind B2 · utility

1Cited by
2References
5Claims
0Family size

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Key dates

Filing dateJul 25, 2006
Grant dateJan 13, 2015
Priority date
Expiry dateNov 17, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/018
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a nitride based single crystal substrate and a method for manufacturing a nitride based semiconductor device. The method for manufacturing the nitride based single crystal substrate includes forming a nitride based single crystal layer on a preliminary substrate; forming a polymer support layer by applying a setting adhesive material having flowability on the upper surface of the nitride based single crystal layer and hardening the applied adhesive material; and separating the nitride based single crystal layer from the preliminary substrate by irradiating a laser beam onto the lower surface of the preliminary substrate. The method for manufacturing the nitride based single crystal substrate is applied to the manufacture of a nitride based semiconductor device having a vertical structure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.